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Paperback Yield-Aware Analog IC Design and Optimization in Nanometer-Scale Technologies Book
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ISBN: 3030415384

ISBN13: 9783030415389

Yield-Aware Analog IC Design and Optimization in Nanometer-Scale Technologies

by , , , et al.
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Format: Paperback

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Book Overview

This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device...

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Computers Computers & Technology Engineering Technology

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