VLSI Fault Modeling and Testing Techniques
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VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking...
Format:Hardcover
Language:English
ISBN:0893917818
ISBN13:9780893917814
Release Date:January 1993
Publisher:Praeger
Length:208 Pages
Weight:0.91 lbs.
Dimensions:0.6" x 5.5" x 8.5"
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