VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

by Anirban Sengupta and Rohit Sharma

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This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling;...

Format:Paperback

Language:English

ISBN:9813297662

ISBN13:9789813297661

Release Date:August 2019

Publisher:Springer

Length:775 Pages

Weight:2.40 lbs.

Dimensions:1.6" x 6.1" x 9.2"

Related Subjects

Computers Computers & Technology

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VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

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