Value Analysis Tear-Down: A New Process for Product Development and Innovation

by Yoshihiko Sat and J. Jerry Kaufman

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This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines traditional tear-down with the technologies of value analysis and value engineering. Within a few years of its public announcement in Japan, value analysis tear-down was adopted by all eleven Japanese automobile manufacturers, and many of the Japanese consumer...

Format:Hardcover

Language:English

ISBN:0831132035

ISBN13:9780831132033

Release Date:January 2004

Publisher:Industrial Press

Length:176 Pages

Weight:1.05 lbs.

Dimensions:0.7" x 6.3" x 9.3"

Related Subjects

Business Business & Investing Economics Engineering Technology

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Value Analysis Tear-Down: A New Process for Product Development and Innovation

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