Transmission Electron Microscopy and Diffractometry of Materials
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Book Overview
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book...
Format:Paperback
Language:English
ISBN:3642433154
ISBN13:9783642433153
Release Date:November 2014
Publisher:Springer
Length:764 Pages
Weight:2.38 lbs.
Dimensions:1.6" x 6.1" x 9.2"
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