Thin Film Materials: Stress, Defect Formation and Surface Evolution

by S. Suresh and L.B. Freund

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Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material...

Format:Paperback

Language:English

ISBN:0521529778

ISBN13:9780521529778

Release Date:January 2009

Publisher:Cambridge University Press

Length:770 Pages

Weight:3.85 lbs.

Dimensions:1.7" x 6.7" x 9.6"

Related Subjects

Engineering Technology

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Thin Film Materials: Stress, Defect Formation and Surface Evolution

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