The Stanford Revision And Extension Of The Binet-Simon Scale For Measuring Intelligence

by Lewis M. Terman

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""The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence"" is a book written by Lewis M. Terman that details the development and use of the Stanford-Binet Intelligence Scale. The book is a revision and extension of the original Binet-Simon Scale, which was created in France in the early 1900s to measure intelligence in children. Terman's revision and extension of the scale was based on research conducted with American...

Format:Paperback

Language:English

ISBN:1163596124

ISBN13:9781163596128

Release Date:September 2010

Publisher:Kessinger Publishing

Length:186 Pages

Weight:0.56 lbs.

Dimensions:0.4" x 6.0" x 9.0"

Related Subjects

Education Education & Reference History Literary Literary Criticism & Collections Literature Literature & Fiction

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The Stanford Revision And Extension Of The Binet-Simon Scale For Measuring Intelligence

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