Skip to content
Menu Button
Scan a barcode
Scan
My Lists
Scan a barcode
Scan
Points EXTRAVaganza! Ends Dec. 1
Earn 2x points sitewide PLUS extra points →
Paperback Testing of Interposer-Based 2.5d Integrated Circuits Book
Share to Facebook
Share to Pinterest
Share to Twitter

ISBN: 3319854615

ISBN13: 9783319854618

Testing of Interposer-Based 2.5d Integrated Circuits

by and
No Customer Reviews

Select Format

Select Condition ThriftBooks Help Icon

Recommended

Format: Paperback

Condition: New

$119.99
50 Available
Ships within 2-3 days
Add to Wish List

Book Overview

This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies. This...

Related Subjects

Computers Computers & Technology Engineering Technology

Customer Reviews

0 rating
Write a review
Trustpilot

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Follow Us

Link to Facebook
Link to Twitter
Link to Pinterest
Link to Tumblr
Link to Instagram
Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured