Test and Diagnosis for Small-Delay Defects

by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

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Book Overview

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Format:Paperback

Language:English

ISBN:1489989528

ISBN13:9781489989529

Release Date:November 2014

Publisher:Springer

Length:212 Pages

Weight:0.73 lbs.

Dimensions:0.5" x 6.1" x 9.2"

Related Subjects

Computers Computers & Technology Engineering Technology

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Test and Diagnosis for Small-Delay Defects

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