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Paperback Test and Diagnosis for Small-Delay Defects Book
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ISBN: 1489989528

ISBN13: 9781489989529

Test and Diagnosis for Small-Delay Defects

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Format: Paperback

Condition: New

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Book Overview

Introduction to VLSI Testing.- Delay Test and System-Delay Defects.- Long Path-Based Hybrid Method.- Process Variations- and Crosstalk-Aware Pattern Selection.- Power Supply Noise- and Crosstalk-Aware Hybrid Method.- SDD-Based Hybrid Method.- Maximizing Crosstalk Effect on Critical Paths.- Maximizing Power Supply Noise on Critical Paths.- Faster-than-at-speed Test.- Introduction to Diagnosis.- Diagnosing Noise-Induced SDDs by Using Dynamic SDF...

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Computers Computers & Technology Engineering Technology

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