Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

by C.Y. Feng, K.C. Khulbe, Takeshi Matsuura, et al.

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Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on the exact kn- ledge of the morphology of a thin selective layer that exists at the surface of the m- brane. Te control of the morphology of the selective...

Format:Paperback

Language:English

ISBN:3642093272

ISBN13:9783642093272

Release Date:November 2010

Publisher:Springer

Length:198 Pages

Weight:0.68 lbs.

Dimensions:0.5" x 6.1" x 9.2"

Related Subjects

Engineering Medical Medical Books Science Science & Math Science & Scientists Science & Technology Technology

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Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

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