Surface Analysis of Polymers by XPS and Static Sims
(Part of the Cambridge Solid State Science Series)
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Book Overview
This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques...
Format:Paperback
Language:English
ISBN:052101753X
ISBN13:9780521017534
Release Date:December 2005
Publisher:Cambridge University Press
Length:216 Pages
Weight:0.77 lbs.
Dimensions:0.5" x 6.7" x 9.6"
Related Subjects
Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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