Scanning Electron Microscopy: Physics of Image Formation and Microanalysis

by Ludwig Reimer

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Format:Paperback

Language:English

ISBN:3642083722

ISBN13:9783642083723

Release Date:December 2010

Publisher:Springer

Length:529 Pages

Weight:1.70 lbs.

Dimensions:1.1" x 6.1" x 9.0"

Related Subjects

Science Science & Math Science & Scientists Science & Technology

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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis

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