RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

No Customer Reviews

Select Format

Select Condition

Book Overview

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve...

Format:Paperback

Language:English

ISBN:1013278623

ISBN13:9781013278624

Release Date:October 2020

Publisher:Saint Philip Street Press

Length:204 Pages

Weight:1.07 lbs.

Dimensions:0.4" x 8.5" x 11.0"

Related Subjects

Engineering Technology

Customer Reviews

0 rating

Write a review

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks^® and the ThriftBooks^® logo are registered trademarks of Thrift Books Global, LLC

RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

Select Format

Select Condition

Recommended

Book Overview

Customer Reviews

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us