Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
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Book Overview
The international market is very competitive for high-tech manufacturers to- day. Achieving competitive quality and reliability for products requires leader- ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de- sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects...
Format:Hardcover
Language:English
ISBN:0792381076
ISBN13:9780792381075
Release Date:January 1998
Publisher:Springer
Length:394 Pages
Weight:1.62 lbs.
Dimensions:1.2" x 6.1" x 9.8"
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