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Hardcover Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development Book
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ISBN: 0792381076

ISBN13: 9780792381075

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

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Format: Hardcover

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Book Overview

The international market is very competitive for high-tech manufacturers to- day. Achieving competitive quality and reliability for products requires leader- ship from the top, good management... This description may be from another edition of this product.

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Engineering Technology

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