Reliability and Failure of Electronic Materials and Devices

by Milton Ohring

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Book Overview

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation,...

Format:Hardcover

Language:English

ISBN:0125249853

ISBN13:9780125249850

Release Date:June 1998

Publisher:Academic Press

Length:720 Pages

Weight:2.50 lbs.

Dimensions:1.4" x 6.2" x 9.2"

Related Subjects

Aerospace Chemical Electrical & Electronics Engineering Industrial, Manufacturing & Operational Systems Mechanical Technology

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