Reflection Electron Microscopy and Spectroscopy for Surface Analysis

by Zhong Lin Wang

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Book Overview

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics...

Format:Paperback

Language:English

ISBN:0521017955

ISBN13:9780521017954

Release Date:August 2005

Publisher:Cambridge University Press

Length:460 Pages

Weight:1.60 lbs.

Dimensions:0.9" x 6.7" x 9.6"

Related Subjects

Chemistry Engineering Experiments, Instruments & Measurement Physics Science Science & Math Science & Scientists Science & Technology Technology

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

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