Progress in Nanoscale Characterization and Manipulation
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Book Overview
Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research Showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy Explores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniques
Format:Hardcover
Language:English
ISBN:981130453X
ISBN13:9789811304538
Release Date:September 2018
Publisher:Springer
Length:508 Pages
Weight:1.98 lbs.
Dimensions:1.1" x 6.1" x 9.2"
Related Subjects
Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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