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Probing Crystal Plasticity at the Nanoscales: Synchrotron X-Ray Microdiffraction
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Probing Crystal Plasticity at the Nanoscales: S... 9812873341 Book Cover

Probing Crystal Plasticity at the Nanoscales: S...

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Edition Description

Introduction.- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab.- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.- Electromigration-induced Plasticity in Cu Interconnects: The Texture Dependence.- Industrial...

Edition Details
Format:Paperback
Language:English
ISBN:9812873341
Format: Paperback
Condition:
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54.99
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