Introduction.- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab.- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.- Electromigration-induced Plasticity in Cu Interconnects: The Texture Dependence.- Industrial Implications of Electromigration-induced Plasticity in Cu Interconnects: Plasticity-amplified Diffusivity.- . Indentation Size Effects in Single Crystal Cu as Revealed...
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