Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

by Harald Overhof and Johann-Martin Spaeth

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The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- peared about 10 years ago. Since then a very active development has oc- curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor- rections...

Format:Paperback

Language:English

ISBN:3642627226

ISBN13:9783642627224

Release Date:September 2012

Publisher:Springer

Length:492 Pages

Weight:1.55 lbs.

Dimensions:1.0" x 6.1" x 9.2"

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Engineering Medical Medical Books Technology

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Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

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