Point and Extended Defects in Semiconductors
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Book Overview
The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an- swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char- acterization of defects, their role in determining transport and optical properties of semiconductor materials and...
Format:Paperback
Language:English
ISBN:146845711X
ISBN13:9781468457117
Release Date:April 2013
Publisher:Springer
Length:287 Pages
Weight:1.15 lbs.
Dimensions:0.6" x 7.0" x 10.0"
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