Photo-Induced Defects in Semiconductors
(Part of the Cambridge Studies in Semiconductor Physics and Microelectronic Engineering Series)
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Book Overview
This book gives a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the authors present properties of DX and EL2 centers in IIISHV compounds. They also...
Format:Paperback
Language:English
ISBN:0521024455
ISBN13:9780521024457
Release Date:March 2006
Publisher:Cambridge University Press
Length:232 Pages
Weight:0.76 lbs.
Dimensions:0.5" x 6.0" x 9.0"
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