Photo-Induced Defects in Semiconductors
(Part of the Cambridge Studies in Semiconductor Physics and Microelectronic Engineering Series)
No Customer Reviews
Select Format
Select Condition 
Book Overview
This book gives a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the authors present properties of DX and EL2 centers in IIISHV compounds. They also deal with additional crystalline materials before giving a detailed description of the properties and kinetics of photo-induced defects in amorphous semiconductors. The book closes with an examination of the effects of photo-induced defects in a range of practical applications. The book will be of great use to graduate students and researchers interested in the physics and materials science of semiconductors.
Format:Paperback
Language:English
ISBN:0521024455
ISBN13:9780521024457
Release Date:March 2006
Publisher:Cambridge University Press
Length:232 Pages
Weight:0.76 lbs.
Dimensions:0.5" x 6.0" x 9.0"
Customer Reviews
0 rating
Copyright © 2025 Thriftbooks.com
Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks ® and the ThriftBooks ® logo are registered trademarks of Thrift Books Global, LLC
ThriftBooks ® and the ThriftBooks ® logo are registered trademarks of Thrift Books Global, LLC
