Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications
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Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for...
Format:Hardcover
Language:English
ISBN:1466581778
ISBN13:9781466581777
Release Date:November 2013
Publisher:CRC Press
Length:336 Pages
Weight:1.80 lbs.
Dimensions:1.3" x 6.2" x 9.2"
Related Subjects
Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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