Nonlinear Transistor Model Parameter Extraction Techniques

(Part of the The Cambridge RF and Microwave Engineering Series)

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Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied...

Format:Hardcover

Language:English

ISBN:0521762103

ISBN13:9780521762106

Release Date:December 2011

Publisher:Cambridge University Press

Length:366 Pages

Weight:1.90 lbs.

Dimensions:0.9" x 6.9" x 9.8"

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Engineering Technology

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Nonlinear Transistor Model Parameter Extraction Techniques

(Part of the The Cambridge RF and Microwave Engineering Series)

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