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Paperback Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield Book
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ISBN: 1493902202

ISBN13: 9781493902200

Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield

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Introduction.- Variability in Nanometer Technologies and Impact on SRAM.- Variarion-Tolerant SRAM Write and Read Assist Techniques.- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control.- A Methodology for Statistical Estimation of Read Access Yield in SRAMs.- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.

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Format: Paperback

Condition: New

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Computers Computers & Technology Engineering Technology

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