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Hardcover Nanometer-Scale Defect Detection Using Polarized Light Book
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ISBN: 1848219369

ISBN13: 9781848219366

Nanometer-Scale Defect Detection Using Polarized Light

by , ,
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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of...

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Format: Hardcover

Condition: New

$152.97
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Engineering Technology

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