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Hardcover Nanometer-Scale Defect Detection Using Polarized Light Book
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ISBN: 1848219369

ISBN13: 9781848219366

Nanometer-Scale Defect Detection Using Polarized Light

by , ,
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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular... This description may be from another edition of this product.

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Format: Hardcover

Condition: New

$152.97
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Engineering Technology

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