Modeling Nanoscale Imaging in Electron Microscopy

by Wolfgang Dahmen, Peter Binev, Thomas Vogt

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Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs...

Format:Hardcover

Language:English

ISBN:146142190X

ISBN13:9781461421900

Release Date:March 2012

Publisher:Springer

Length:182 Pages

Weight:0.90 lbs.

Dimensions:0.8" x 6.2" x 9.2"

Related Subjects

Engineering Science Science & Math Science & Scientists Science & Technology Technology

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Modeling Nanoscale Imaging in Electron Microscopy

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