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Paperback Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact Book
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ISBN: 3030067475

ISBN13: 9783030067472

Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact

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This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for...

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Format: Paperback

Condition: New

$199.99
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Engineering Technology

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