Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
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Book Overview
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half...
Format:Hardcover
Language:English
ISBN:0470822988
ISBN13:9780470822982
Release Date:June 2008
Publisher:John Wiley & Sons
Length:337 Pages
Weight:1.65 lbs.
Dimensions:0.9" x 6.9" x 9.8"
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