Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

by North Carolina State University and Lucille A. Giannuzzi

No Customer Reviews

Select Format

Select Condition

Book Overview

Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools,...

Format:Paperback

Language:English

ISBN:1441935746

ISBN13:9781441935748

Release Date:October 2010

Publisher:Springer

Length:357 Pages

Weight:1.16 lbs.

Dimensions:0.8" x 6.1" x 9.2"

Related Subjects

Engineering Technology

Customer Reviews

0 rating

Write a review

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks^® and the ThriftBooks^® logo are registered trademarks of Thrift Books Global, LLC

Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

Select Format

Select Condition

Recommended

Book Overview

Customer Reviews

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us