Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

by North Carolina State University and Lucille A. Giannuzzi

No Customer Reviews

Select Format

Select Condition

Book Overview

The Focused Ion Beam Instrument.- Ion - Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications - a Review.- Practical Aspects of FIB Tem Specimen Preparation.-...

Format:Paperback

Language:English

ISBN:1441935746

ISBN13:9781441935748

Release Date:October 2010

Publisher:Springer

Length:357 Pages

Weight:1.16 lbs.

Dimensions:0.8" x 6.1" x 9.2"

Related Subjects

Engineering Technology

Customer Reviews

0 rating

Write a review

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks^® and the ThriftBooks^® logo are registered trademarks of Thrift Books Global, LLC

Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

Select Format

Select Condition

Recommended

Book Overview

Customer Reviews

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us