Introduction to Advanced System-On-Chip Test Design and Optimization

by Erik Larsson

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SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. It first introduces readers to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. Then it discusses SOC related...

Format:Paperback

Language:English

ISBN:1441952691

ISBN13:9781441952691

Release Date:February 2011

Publisher:Springer

Length:388 Pages

Weight:1.26 lbs.

Dimensions:0.8" x 6.1" x 9.2"

Related Subjects

Engineering Technology

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Introduction to Advanced System-On-Chip Test Design and Optimization

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