Integrated Circuit Defect-Sensitivity: Theory and Computational Models
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Book Overview
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers...
Format:Paperback
Language:English
ISBN:1461363837
ISBN13:9781461363835
Release Date:February 2014
Publisher:Springer
Length:167 Pages
Weight:0.62 lbs.
Dimensions:0.4" x 6.1" x 9.2"
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