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Paperback Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach Book
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ISBN: 0367400979

ISBN13: 9780367400972

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

by , , , et al.
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This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective...

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Format: Paperback

Condition: New

$60.32
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Engineering Technology

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