Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

by Michael G. Pecht, Lall, Edward B. Hakim, et al.

No Customer Reviews

Select Format

Select Condition

Book Overview

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective...

Format:Hardcover

Language:English

ISBN:0849394503

ISBN13:9780849394508

Release Date:June 1997

Publisher:CRC Press

Length:328 Pages

Weight:2.09 lbs.

Dimensions:0.8" x 7.3" x 10.3"

Related Subjects

Aerospace Electrical & Electronic Engineering Electrical & Electronics Engineering Industrial, Manufacturing & Operational Systems Mechanical Mechanical Engineering Technology

Customer Reviews

0 rating

Write a review

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks^® and the ThriftBooks^® logo are registered trademarks of Thrift Books Global, LLC

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

Select Format

Select Condition

Recommended

Book Overview

Customer Reviews

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us