Iddq Testing of VLSI Circuits
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Book Overview
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data...
Format:Hardcover
Language:English
ISBN:0792393155
ISBN13:9780792393153
Release Date:December 1992
Publisher:Springer
Length:124 Pages
Weight:0.15 lbs.
Dimensions:0.4" x 7.0" x 10.0"
Related Subjects
Circuits Computers Computers & Technology Electrical & Electronics Engineering TechnologyCustomer Reviews
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