High Resolution X-Ray Diffractometry And Topography

by D. Keith Bowen, Brian K Tanner, B.K. Tanner, et al.

No Customer Reviews

Select Format

Select Condition

Book Overview

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography...

Format:Paperback

Language:English

ISBN:0367400634

ISBN13:9780367400637

Release Date:October 2019

Publisher:CRC Press

Length:264 Pages

Weight:0.95 lbs.

Dimensions:0.7" x 6.8" x 9.5"

Related Subjects

Allied Health Professions Chemical Chemistry Crystallography Engineering General & Reference Light Optics Physics Radiologic & Ultrasound Technology Science Science & Math Science & Scientists Science & Technology

Customer Reviews

0 rating

Write a review

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks^® and the ThriftBooks^® logo are registered trademarks of Thrift Books Global, LLC

High Resolution X-Ray Diffractometry And Topography

Select Format

Select Condition

Recommended

Book Overview

Customer Reviews

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us