High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test...
Format:Hardcover
Language:English
ISBN:1402072554
ISBN13:9781402072550
Release Date:September 2002
Publisher:Springer
Length:250 Pages
Weight:1.25 lbs.
Dimensions:0.8" x 6.3" x 9.7"
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