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Paperback High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip Book
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ISBN: 9811093210

ISBN13: 9789811093210

High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip

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Format: Paperback

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Book Overview

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions,...

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Computers Computers & Technology Engineering Technology

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