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Hardcover Hierarchical Modeling for VLSI Circuit Testing Book

ISBN: 079239058X

ISBN13: 9780792390589

Hierarchical Modeling for VLSI Circuit Testing

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Format: Hardcover

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Book Overview

Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob- lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in...

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