From Scientific Instrument to Industrial Machine: Coping with Architectural Stress in Embedded Systems
(Part of the SpringerBriefs in Electrical and Computer Engineering Series)
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Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific...
Format:Paperback
Language:English
ISBN:9400741464
ISBN13:9789400741461
Release Date:April 2012
Publisher:Springer
Length:112 Pages
Weight:0.41 lbs.
Dimensions:0.3" x 6.1" x 9.2"
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