Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films

by Charles A. Evans Jr., Shaun Wilson, C. Richard Brundle

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This text is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This volume describes the techniques used in... This description may be from another edition of this product.

Format:Hardcover

Language:English

ISBN:0750691689

ISBN13:9780750691680

Release Date:September 1992

Publisher:Butterworth-Heinemann

Length:800 Pages

Weight:2.65 lbs.

Dimensions:1.6" x 6.4" x 9.6"

Related Subjects

Engineering Technology

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Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films

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