Electronic Thin-Film Reliability
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Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on a graduate course at UCLA given by the author, this new book focuses on reliability science and the processing of thin films. Early...
Format:Hardcover
Language:English
ISBN:0521117194
ISBN13:9780521516136
Release Date:August 2010
Publisher:Cambridge University Press
Length:412 Pages
Weight:2.11 lbs.
Dimensions:0.9" x 6.9" x 9.8"
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