Digital Integrated Circuit Testing from a Quality Perspective

by Eugene R. Hnatek

No Customer Reviews

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the... This description may be from another edition of this product.

Format:Hardcover

Language:English

ISBN:0442006438

ISBN13:9780442006433

Release Date:August 1993

Publisher:Springer

Length:180 Pages

Weight:1.05 lbs.

Dimensions:0.7" x 6.2" x 9.7"

Related Subjects

Engineering Technology

Customer Reviews

0 rating

Write a review

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks^® and the ThriftBooks^® logo are registered trademarks of Thrift Books Global, LLC

Digital Integrated Circuit Testing from a Quality Perspective

Recommended

Customer Reviews

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us