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Hardcover Digital Integrated Circuit Testing from a Quality Perspective Book
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ISBN: 0442006438

ISBN13: 9780442006433

Digital Integrated Circuit Testing from a Quality Perspective

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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the... This description may be from another edition of this product.

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Format: Hardcover

Condition: New

$109.99
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Engineering Technology

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