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Paperback Design, Analysis and Test of Logic Circuits Under Uncertainty Book
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ISBN: 9400797982

ISBN13: 9789400797987

Design, Analysis and Test of Logic Circuits Under Uncertainty

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Book Overview

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis...

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Computers Computers & Technology Engineering Technology

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