Delay Fault Testing for VLSI Circuits

by Angela Krstic and Kwang-Ting (Tim) Cheng

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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly.... This description may be from another edition of this product.

Format:Paperback

Language:English

ISBN:1461375614

ISBN13:9781461375616

Release Date:October 2012

Publisher:Springer

Length:191 Pages

Weight:0.66 lbs.

Dimensions:0.4" x 6.1" x 9.2"

Related Subjects

Architecture CAD Computer Science Computers Computers & Technology Drafting & Presentation Electrical & Electronics Engineering Graphic Design Programming

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Delay Fault Testing for VLSI Circuits

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