Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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Book Overview
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The...
Format:Hardcover
Language:English
ISBN:0387465464
ISBN13:9780387465463
Release Date:June 2007
Publisher:Springer
Length:328 Pages
Weight:1.59 lbs.
Dimensions:0.7" x 6.4" x 9.3"
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