Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics
No Customer Reviews
This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending...
Format:Paperback
Language:English
ISBN:1461355737
ISBN13:9781461355731
Release Date:October 2012
Publisher:Springer
Length:112 Pages
Weight:0.44 lbs.
Dimensions:0.3" x 6.1" x 9.2"
Customer Reviews
0 rating
Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
