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Characterization of Crystal Growth Defects by X... 147571128X Book Cover

Characterization of Crystal Growth Defects by X...

Edition Description

This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular...

Edition Details
Format:Paperback
Language:English
ISBN:147571128X
Format: Paperback
Condition:
$
60.57
50 Available
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