Characterization of Crystal Growth Defects by X-Ray Methods

by B.K. Tanner

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute...

Format:Paperback

Language:English

ISBN:147571128X

ISBN13:9781475711288

Release Date:December 2012

Publisher:Springer

Length:589 Pages

Weight:2.32 lbs.

Dimensions:1.2" x 7.0" x 10.0"

Related Subjects

Science Science & Math Science & Scientists Science & Technology

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Characterization of Crystal Growth Defects by X-Ray Methods

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