CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms

by Flora Li and Arokia Nathan

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Overview of CCD.- CCD Imaging in the Ultraviolet (UV) Regime.- Silicon.- Silicon Dioxide.- Si-SiO2 Interface.- General Effects of Radiation.- Effects of Radiation on CCDs.- UV-Induced Effects in Si.- UV Laser Induced Effects in SiO2.- UV Laser Induced Effects at the Si-SiO2 Interface.- CCD Measurements at 157nm.- Design Optimizations for Future Research.- Concluding Remarks.

Format:Paperback

Language:English

ISBN:3642061524

ISBN13:9783642061523

Release Date:October 2010

Publisher:Springer

Length:232 Pages

Weight:0.76 lbs.

Dimensions:0.5" x 6.1" x 9.2"

Related Subjects

Engineering Science Science & Math Science & Scientists Science & Technology Technology

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CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms

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